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Monte Carlo modeling in the low-energy domain of the secondary electron emission of polymethylmethacrylate for critical-dimension scanning electron microscopy

✍ Scribed by Ciappa, Mauro


Book ID
121680156
Publisher
The International Society for Optical Engineering
Year
2010
Tongue
English
Weight
343 KB
Volume
9
Category
Article
ISSN
1932-5150

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