Monitoring the Thickness of Thin MgF_2 and LiF Films on Al by Reflectance Measurements Using the 1216-Å Line of Hydrogen

✍ Scribed by Hutcheson, E. T. ;Cox, J. T. ;Hass, G. ;Hunter, W. R.

• Book ID: 115322220
• Publisher: The Optical Society
• Year: 1972
• Tongue: English
• Weight: 824 KB
• Volume: 11
• Category: Article
• ISSN: 1559-128X
• DOI: 10.1364/AO.11.001590