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Monitoring the arbitrary thickness of optical thin films and their error simulation: a method

✍ Scribed by Zhu, Zhen ;Li, Wensheng ;Hua, Yuansen

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

A new approach for the thickness monitor

✍ TGK Murthy; HN Rao; KSR Anjaneyulu 📂 Article 📅 1972 🏛 Elsevier Science 🌐 English ⚖ 119 KB

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✍ Daneu, V. ;Sanchez, A. 📂 Article 📅 1974 🏛 The Optical Society 🌐 English ⚖ 951 KB

Adsorption-ellipsometry method of studyi

✍ Tolmachev, V. A. 📂 Article 📅 1999 🏛 Optical Society of America 🌐 English ⚖ 156 KB

2.11 Prediction of the optical thickness

✍ F Papini; M Perrot 📂 Article 📅 1967 🏛 Elsevier Science 🌐 English ⚖ 165 KB

Numerical method for the ellipsometric d

✍ T. Easwarakhanthan; C. Michel; S. Ravelet 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 564 KB

Retrieval of optical constants and thick

✍ Chambouleyron, I. ;Martínez, J. M. ;Moretti, A. C. ;Mulato, M. 📂 Article 📅 1997 🏛 The Optical Society 🌐 English ⚖ 334 KB