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Monitoring of ISFET encapsulation aging by impedance measurements

✍ Scribed by J.M. Chovelon; N. Jaffrezic-Renault; Y. Cros; J.J. Fombon; D. Pedone

Publisher: Elsevier Science
Year: 1991
Tongue: English
Weight: 812 KB
Volume: 3
Category: Article
ISSN: 0925-4005
DOI: 10.1016/0925-4005(91)85006-5

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