Molecular dynamics simulations of sequential cluster ion impacts
β Scribed by Takaaki Aoki; Jiro Matsuo
- Publisher
- Elsevier Science
- Year
- 2005
- Tongue
- English
- Weight
- 480 KB
- Volume
- 228
- Category
- Article
- ISSN
- 0168-583X
No coin nor oath required. For personal study only.
β¦ Synopsis
Molecular dynamics (MD) simulations of cluster and solid target collisions were performed in order to understand the relationship between surface deformation processes and cluster sizes. MD simulations of single impacts of clusters with various sizes showed that, when a cluster size is less than 10 000 atoms, a crater-like damage could be caused at 20 keV of total energy, while no damage was observed at Ar 10 000 and Ar 20 000 clusters. The surface morphology change was examined by MD of sequential irradiation of Ar clusters under various conditions. When the initial roughness of the surface was about 10 A Λin r.m.s. and the total incident energy was 20 keV, the surface roughness was reduced with the impact of Ar 13 333 or larger cluster. The MD results give information about the final value and decay speed of surface roughness, which are required to optimize the cluster ion irradiation condition for various nano-scale modification processes.
π SIMILAR VOLUMES
Cluster ion implantation is a useful technique for manufacturing ultra-shallow-junction. In order to investigate the depth and lateral distribution as well as cluster dissociation, we performed a molecular dynamics simulation that injects 200-500 eV/atom boron cluster into single crystal silicon. Th
Model systems of sodium iodide dissolved in dimethyl ether or 1,Zdimethoxyethane (glyme) were studied in order to investigate the structural and dynamic properties of ionic solutions in small and polymeric ethers. Full molecular dynamics simulations were performed at a range of different salt concen