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MODIFIED SPECKLE-SHEARING INTERFEROMETRY FOR MEASUREMENT OF PARTIAL DERIVATIVES OF SURFACE DISPLACEMENTS

โœ Scribed by S.L. Yen; C.W. Kuo; G.P. Hu


Book ID
114856631
Publisher
John Wiley and Sons
Year
1994
Tongue
English
Weight
509 KB
Volume
18
Category
Article
ISSN
0732-8818

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The paper presents the use of Holographic Interferometry and Electronic Speckle Pattern Interferometry for the measurement of dynamic surface displacements. A concise theoretical background of the optical phenomena on which the two techniques are based is given. Analysis of holographic and speckle f