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Modified C-t technique for determining the generation lifetime profile in MeV He+ implanted silicon

✍ Scribed by T Mohácsy; NQ Khánh; M Ádám; J Gyulai


Book ID
108390410
Publisher
Elsevier Science
Year
1998
Tongue
English
Weight
246 KB
Volume
50
Category
Article
ISSN
0042-207X

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