✦ LIBER ✦
A new technique for determining the generation lifetime profile in thin semiconductor films with application to silicon-on-insulator (SOI) substrates
✍ Scribed by H. Chen; F. Brady; S. Li; W. Krull
- Book ID
- 126769245
- Publisher
- IEEE
- Year
- 1989
- Tongue
- English
- Weight
- 327 KB
- Volume
- 10
- Category
- Article
- ISSN
- 0741-3106
- DOI
- 10.1109/55.43115
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