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Modification of the methanation activity on a Ni(111) surface by Ar ion bombardment

✍ Scribed by A. Berkó; H.P. Bonzel

Publisher
Elsevier Science
Year
1991
Weight
74 KB
Volume
251-252
Category
Article
ISSN
0167-2584

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A modeling work has been conducted on a phenomenon called post ion milling (PIM), a post-treatment of Ar + ion sputtering to modify nanostructures on solid surface. It was found by experiments that for PIM with a sufficiently low ion flux, both the average dot size and the surface roughness of Si na