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Modelling the response of polymeric thin-film devices subject to X-ray irradiation

✍ Scribed by A. Alderson; S.J. Vinton; S.C. Wimbush

Book ID
117542747
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
202 KB
Volume
102
Category
Article
ISSN
0379-6779

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The techniques of X-ray and neutron reflectometry are compared with respect to their application for the investigation of polymeric thin films. While the use of X-ray reflectometry is limited due to the small contrast between most polymers, deuteration offers many possibilities for neutron reflectom