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Modelling of thin-film HTS/ferroelectric interdigital capacitors

โœ Scribed by Gevorgian, S.; Carlsson, E.; Rudner, S.; Wernlund, L.-D.; Wang, X.; Helmersson, U.

Book ID
114454767
Publisher
The Institution of Electrical Engineers
Year
1996
Tongue
English
Weight
537 KB
Volume
143
Category
Article
ISSN
1350-2417

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## Abstract A procedure to include conductor loss in interdigital capacitor based dielectric constant measurements is proposed. The effect of conductor loss and contact resistance can be regarded as a series resistor connected to the interdigital capacitor. If the thickness of the conductor film is