## Abstract A procedure to include conductor loss in interdigital capacitor based dielectric constant measurements is proposed. The effect of conductor loss and contact resistance can be regarded as a series resistor connected to the interdigital capacitor. If the thickness of the conductor film is
β¦ LIBER β¦
Analysis of interdigitated thin film capacitors
β Scribed by L. Binotto; G.F. Piacentini
- Publisher
- Elsevier Science
- Year
- 1972
- Tongue
- English
- Weight
- 349 KB
- Volume
- 12
- Category
- Article
- ISSN
- 0040-6090
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