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Modelling of Residual Stress Development in Electronic Materials and Devices

✍ Scribed by R. Krawietz; M. Bobeth; W. Pompe; W. Wersing; B. Winkler

Publisher: John Wiley and Sons
Year: 2002
Tongue: English
Weight: 197 KB
Volume: 4
Category: Article
ISSN: 1438-1656
DOI: 10.1002/1527-2648(20020806)4:8<565::aid-adem565>3.0.co;2-2

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