𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Modelling conditions for nanoelectronics, and elaboration for set circuits

✍ Scribed by Arthur H. M. van Roermund


Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
102 KB
Volume
31
Category
Article
ISSN
0098-9886

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Double exponential transform and general
✍ Martinelli, G.; D'Acunto, C. πŸ“‚ Article πŸ“… 1997 πŸ› John Wiley and Sons 🌐 English βš– 393 KB πŸ‘ 2 views

In this paper a new tool, i.e. the double exponential transform, is introduced for characterizing a non-linear dynamic circuit directly on the basis of its elements. The resulting characterization aims to improve the computational cost connected with the analysis and to add flexibility to the identi

PDF of distance function for level-set f
✍ P. Nilsson; X. S. Bai πŸ“‚ Article πŸ“… 2003 πŸ› John Wiley and Sons 🌐 English βš– 394 KB

## Abstract The difference between a presumed distribution of flamelet position and a numerically simulated distribution of distance function (a signed distance to flamelet) is investigated. It is shown that even if the distribution of flamelet position is symmetrical and close to Gaussian, the dis

Generalized Constraint Qualifications an
✍ Huang Yong-Wei πŸ“‚ Article πŸ“… 2002 πŸ› Elsevier Science 🌐 English βš– 106 KB

In this paper we discuss the connections of four generalized constraint qualifications for set-valued vector optimization problems with constraints. Then some K-T type necessary and sufficient optimality conditions are derived, in terms of the contingent epiderivatives.

Comparing the MESFET and HEMT models for
✍ R. Touhami; M. C. E. Yagoub; H. Baudrand πŸ“‚ Article πŸ“… 2007 πŸ› John Wiley and Sons 🌐 English βš– 568 KB

## Abstract In this paper, the relative advantages of several widely used MESFET and HEMT models have been compared. The nonlinear behaviours of the Curtice quadratic, Curtice cubic, Statz, Materka, Rodriguez, and Chalmers models were investigated through their current–voltage–temperature character