Modeling study of the impact of surface roughness on silicon and Germanium UTB MOSFETs

✍ Scribed by Low, T.; Ming-Fu Li; Samudra, G.; Yee-Chia Yeo; Chunxiang Zhu; Chin, A.; Dim-Lee Kwong

• Book ID: 114618002
• Publisher: IEEE
• Year: 2005
• Tongue: English
• Weight: 880 KB
• Volume: 52
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2005.857188