Modeling of the hot electron subpopulation and its application to impact ionization in submicron silicon devices-Part II: numerical solutions

✍ Scribed by Scrobohaci, P.G.; Tang, T.-W.

• Book ID: 114535763
• Publisher: IEEE
• Year: 1994
• Tongue: English
• Weight: 521 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.293348