Modeling of the hot electron subpopulation and its application to impact ionization in submicron silicon devices-Part I: transport equations

✍ Scribed by Scrobohaci, P.G.; Ting-Bei Tang

• Book ID: 114535762
• Publisher: IEEE
• Year: 1994
• Tongue: English
• Weight: 664 KB
• Volume: 41
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.293347