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Modeling of single-event effects in circuit-hardened high-speed SiGe HBT logic

โœ Scribed by Niu, G.; Krithivasan, R.; Cressler, J.D.; Marshall, P.; Marshall, C.; Reed, R.; Harame, D.L.


Book ID
120544493
Publisher
IEEE
Year
2001
Tongue
English
Weight
143 KB
Volume
48
Category
Article
ISSN
0018-9499

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