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Modeling of Integrated Circuit Yield Using a Spatial Nonhomogeneous Poisson Process

✍ Scribed by Jung Yoon Hwang; Way Kuo; Chunghun Ha

Book ID: 114669506
Publisher: IEEE
Year: 2011
Tongue: English
Weight: 288 KB
Volume: 24
Category: Article
ISSN: 0894-6507
DOI: 10.1109/tsm.2011.2143733

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