𝔖 Bobbio Scriptorium

✦ LIBER ✦

Modeling of failure probability and statistical design of SRAM array for yield enhancement in nanoscaled CMOS

✍ Scribed by Mukhopadhyay, S.; Mahmoodi, H.; Roy, K.

Book ID: 117907417
Publisher: IEEE
Year: 2005
Tongue: English
Weight: 896 KB
Volume: 24
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2005.852295

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[Wiley Series in Probability and Statist

[Wiley Series in Probability and Statistics] Design and Analysis of Experiments (Special Designs and Applications) || Optimal Designs for Generalized Linear Models

✍ Hinkelmann, Klaus 📂 Article 📅 2012 🏛 John Wiley & Sons, Inc. ⚖ 787 KB

[Wiley Series in Probability and Statist

[Wiley Series in Probability and Statistics] Design and Analysis of Experiments (Special Designs and Applications) || Designs for Choice Experiments for the Multinomial Logit Model

✍ Hinkelmann, Klaus 📂 Article 📅 2012 🏛 John Wiley & Sons, Inc. ⚖ 969 KB

[Wiley Series in Probability and Statist

[Wiley Series in Probability and Statistics] Design and Analysis of Experiments (Special Designs and Applications) || Search Linear Model for Identification and Discrimination

✍ Hinkelmann, Klaus 📂 Article 📅 2012 🏛 John Wiley & Sons, Inc. ⚖ 310 KB

[Widerkehr and Associates 2004 Symposium

[Widerkehr and Associates 2004 Symposium on VLSI Circuits. Digest of Technical Papers - Honolulu, HI, USA (17-19 June 2004)] 2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.04CH37525) - Modeling and estimation of failure probability due to parameter variations in nano-scale SRAMs for yield enhancement

✍ Mukhopadhyay, S.; Mahmoodi-Meimand, H.; Roy, K. 📂 Article 📅 2004 🏛 Widerkehr and Associates ⚖ 367 KB