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[Widerkehr and Associates 2004 Symposium on VLSI Circuits. Digest of Technical Papers - Honolulu, HI, USA (17-19 June 2004)] 2004 Symposium on VLSI Circuits. Digest of Technical Papers (IEEE Cat. No.04CH37525) - Modeling and estimation of failure probability due to parameter variations in nano-scale SRAMs for yield enhancement

✍ Scribed by Mukhopadhyay, S.; Mahmoodi-Meimand, H.; Roy, K.

Book ID: 121323181
Publisher: Widerkehr and Associates
Year: 2004
Weight: 367 KB
Category: Article
ISBN-13: 9780780382879
DOI: 10.1109/VLSIC.2004.1346504

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