๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Modeling of cumulative damage effects on ion-implantation profiles

โœ Scribed by Kevin M. Klein; Changhae Park; Al F. Tasch


Book ID
113281498
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
478 KB
Volume
59-60
Category
Article
ISSN
0168-583X

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES


Damage profile on high energy ion implan
โœ Ascheron, C. ;Otto, G. ;Flagmeyer, R. ;Zschau, H.-E. ;Bugrov, V. N. ;Karamyan, S ๐Ÿ“‚ Article ๐Ÿ“… 1986 ๐Ÿ› John Wiley and Sons ๐ŸŒ English โš– 207 KB