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Modeling neutron ionization effects on high-density CMOS circuit elements

✍ Scribed by G. I. Zebrev

Book ID: 110214251
Publisher: Springer
Year: 2006
Tongue: English
Weight: 204 KB
Volume: 35
Category: Article
ISSN: 1063-7397
DOI: 10.1134/s1063739706030073

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