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Modeling of the effect of low intensity ionizing radiation on MOS elements of VLSI circuits

โœ Scribed by M. N. Levin; E. V. Bondarenko; A. V. Tatarintsev; V. R. Gitlin; V. A. Makarenko


Book ID
111501269
Publisher
Allerton Press Inc
Year
2009
Tongue
English
Weight
158 KB
Volume
73
Category
Article
ISSN
1062-8738

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