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Modeling Ion-Induced Pulses in Radiation-Hard SOI Integrated Circuits

✍ Scribed by Fulkerson, David E.; Nelson, David K.; Carlson, Roy M.; Vogt, Eric E.

Book ID: 111863914
Publisher: IEEE
Year: 2007
Tongue: English
Weight: 777 KB
Volume: 54
Category: Article
ISSN: 0018-9499
DOI: 10.1109/tns.2007.903177

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