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[IEEE 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - Shanghai, China (2006.10.23-2006.10.26)] 2006 8th International Conference on Solid-State and Integrated Circuit Technology Proceedings - A novel approach to compare the charge buildup induced by co-60 and X-ray radiation in SOI buried oxides

✍ Scribed by Tian, H.; Zhang, Zh.; Zhang, E.; He, W.; Yang, H.; Yu, W.; Wang, X.

Book ID: 111687135
Publisher: IEEE
Year: 2006
Weight: 91 KB
Volume: 0
Category: Article
ISBN-13: 9781424401604
DOI: 10.1109/icsict.2006.306178

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