Modeling and Significance of Fringe Capacitance in Nonclassical CMOS Devices With Gate–Source/Drain Underlap

✍ Scribed by Seung-Hwan Kim; Fossum, J.G.; Ji-Woon Yang

• Book ID: 114618390
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 620 KB
• Volume: 53
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2006.880369