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Modeling and analysis of loading effect on leakage of nanoscaled bulk-CMOS logic circuits

✍ Scribed by Mukhopadhyay, S.; Bhunia, S.; Roy, K.

Book ID: 117907500
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 546 KB
Volume: 25
Category: Article
ISSN: 0278-0070
DOI: 10.1109/tcad.2005.855934

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