Modeling absorption of rough interface between dielectric and conductive medium

✍ Scribed by Xiaoxiong Gu; Leung Tsang; Henning Braunisch; Peng Xu

• Book ID: 102520426
• Publisher: John Wiley and Sons
• Year: 2006
• Tongue: English
• Weight: 385 KB
• Volume: 49
• Category: Article
• ISSN: 0895-2477
• DOI: 10.1002/mop.22023

✦ Synopsis

Abstract

The effects of a random rough surface between dielectric and lossy conductive medium on power absorption are analyzed by considering incident plane waves impinging on the interface. We use two methods to formulate and solve the 2‐D problem: the two‐media small perturbation method to second order (SPM2) and the numerical system transfer operator matrix method, referred to as T‐matrix method. The two methods are in agreement within the regimes of validity. The results show significant difference between absorption of a rough surface and that of a smooth surface. Surface fields are further examined numerically. © 2006 Wiley Periodicals, Inc. Microwave Opt Technol Lett 49: 7–13, 2007; Published online in Wiley InterScience (www.interscience.wiley.com). DOI 10.1002/mop.22023