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Correlation between electron spin resonance, electrical conductivity and optical absorption edge of co-evaporated thin films of the dielectric system SiO/V2O5

โœ Scribed by F. A. S. Al-Ramadhan; K. I. Arshak; C. A. Hogarth


Publisher
Springer
Year
1984
Tongue
English
Weight
340 KB
Volume
19
Category
Article
ISSN
0022-2461

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