Correlation between electron spin resonance, electrical conductivity and optical absorption edge of co-evaporated thin films of the dielectric system SiO/V2O5

✍ Scribed by F. A. S. Al-Ramadhan; K. I. Arshak; C. A. Hogarth

• Publisher: Springer
• Year: 1984
• Tongue: English
• Weight: 340 KB
• Volume: 19
• Category: Article
• ISSN: 0022-2461
• DOI: 10.1007/bf02396941