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Model for the radiation degradation of polycrystalline silicon films

โœ Scribed by Nakabayashi, M.; Ohyama, H.; Takakura, K.; Simoen, E.; Claeys, C.


Book ID
126763901
Publisher
IEEE
Year
2003
Tongue
English
Weight
638 KB
Volume
50
Category
Article
ISSN
0018-9499

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Radiation damage of polycrystalline sili
โœ H. Ohyama; M. Nakabayashi; E. Simoen; C. Claeys; K. Tanaka; K. Kobayashi ๐Ÿ“‚ Article ๐Ÿ“… 2002 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 268 KB