๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Mixed silicon carbide clusters studied by laser ablation Fourier transform ICR mass spectrometry

โœ Scribed by Paul F. Greenwood; Gary D. Willett; Michael A. Wilson

Book ID
102964846
Publisher
John Wiley and Sons
Year
1993
Tongue
English
Weight
971 KB
Volume
28
Category
Article
ISSN
1076-5174

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โœฆ Synopsis

Ions produced by the 1064 nm Nd:YAG laser ablation of various Si-C samples include mixed silicon carbon (Si,C,,) cluster ions of low molecular mass. Unique Si,C, cluster ion distributions are observed. A charge state effect for Si,C, clusters is evident from differences between the respectively charged distributions. This may be accounted for by either differing energetics and/or differing formation mechanisms for positive and negative Si,C, cluster ions. Several specific Si,C, clusters of probable high stability consistently dominate the mass spectra. The chemistry of the more abundant Si$, ions was probed by collision-induced dissociation and ion-molecule reactivity experiments. Similar Si,C;* dissociation results in the common loss of an Si ion. Parent Si,C, ion and small neutral reagent reactants give rise to oxidation, addition and exchange reactions. ' (2 d rn < 13) and Sin-(1 d n < 4) clusters are observed.

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