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Misfit Dislocation Patterning in Thin Films

✍ Scribed by K. Cholevas; N. Liosatos; A. E. Romanov; M. Zaiser; M. Zaiser; E. C. Aifantis; E. C. Aifantis


Publisher
John Wiley and Sons
Year
1998
Tongue
English
Weight
193 KB
Volume
209
Category
Article
ISSN
0370-1972

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## Abstract The quantitative study by transmission electron microscopy (TEM) of crystalline defects in ultra‐thin film deposited on a substrate system is often complicated by the elastic interactions between short dislocation segments and the free surface of the film. It is shown, in the frame of i