Mirror Electron Microscopy (MEM): Work function and imaging of an electron beam biased junction of silicon (100)

✍ Scribed by J.C. Dupuy; A. Sibai; B. Vilotitch

• Book ID: 118985350
• Publisher: Elsevier Science
• Year: 1984
• Tongue: English
• Weight: 712 KB
• Volume: 147
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/0039-6028(84)90175-4