Mirror electron microscopy (MEM): Work function and imaging of an electron beam biased junction of silicon (100)

✍ Scribed by J.C. Dupuy; A. Sibai; B. Vilotitch

• Book ID: 104192724
• Publisher: Elsevier Science
• Year: 1984
• Weight: 41 KB
• Volume: 147
• Category: Article
• ISSN: 0167-2584
• DOI: 10.1016/0167-2584(84)90677-7