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Minority carrier lifetimes using compensated differental open circuit voltage decay

โœ Scribed by Martin A. Green


Publisher
Elsevier Science
Year
1983
Tongue
English
Weight
437 KB
Volume
26
Category
Article
ISSN
0038-1101

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Photo-induced recombination in minority-
โœ Y.K. Hsieh; Y. Trisno; H.C. Card ๐Ÿ“‚ Article ๐Ÿ“… 1988 ๐Ÿ› Elsevier Science โš– 486 KB

The photo-induced open-circuit voltage decay (POVD) method has been used to measure the minority-carrier lifetime on induced pn-junction devices in moderately doped germanium. We found the variations in lifetime with optical illumination intensity, wavelength and temperature depart substantially fro