The effective minority carrier lifetime in polycrystalline semiconductors is determined in terms of the grain size and the recombination velocity at the grain boundaries. The effect of the grain boundaries is to reduce the effective lifetime when the grain size is smaller than few diffusion lengths.
โฆ LIBER โฆ
Minority Carrier Lifetime in Polycrystalline Semiconductors
โ Scribed by Kumar, K. Ram ;Satyam, M.
- Publisher
- John Wiley and Sons
- Year
- 1983
- Tongue
- English
- Weight
- 222 KB
- Volume
- 77
- Category
- Article
- ISSN
- 0031-8965
No coin nor oath required. For personal study only.
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