Minority carrier behavior in silicon—Measurement results derived from the Shockley-Haynes experiment

✍ Scribed by B. Krüger; Th. Friese; F. El-Ratel; W. Sharabati; H.G. Wagemann

• Book ID: 103394068
• Publisher: Elsevier Science
• Year: 1996
• Tongue: English
• Weight: 412 KB
• Volume: 39
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(95)00407-6