Millimeter and submillimeter wave surface impedance of YBa2Cu3O7−δ thin films with reduced low temperature absorption
✍ Scribed by N. Klein; U. Dähne; U. Poppe; H. Soltner; B. Kabius; K. Urban; J. Schubert; W. Zander; S. Orbach; S. Hensen; G. Müller; H. Piel; B.P. Gorshunov; G.V. Kozlov; S.P. Lebedev; A.A. Volkov
- Publisher
- Elsevier Science
- Year
- 1991
- Tongue
- English
- Weight
- 272 KB
- Volume
- 185-189
- Category
- Article
- ISSN
- 0921-4534
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✦ Synopsis
The surface impedance of epitaxiai YBa~CuaOT_ ~ thin films prepared by high oxygen pressure dc sputtering as well as by excimer laser ablation on ISaAIO 3 has been measured at 87GHz by a cavity endplate replacement technique and between 100GHz and 1THz by transmission experiments, some of our films with low dcresistivity values (p(100K)=40-S0t~t~cm, p(300K)Ip(100K} >3} and improved microstructure exhibit besides the initial steep falloff at T c a further gradual decrease of the surface resistance below about 50K by at least one order of magnitude, presently limited by the sensitivity of our measurement techniques. The dynamic conductivity determined from the surface impedance shows a maximum below T~ looking similar to a BCS coherence peak. Beyond the relevance for the understanding of the conduction me'chanism our low loss films are important for millimeter-and submillimeter wave applications below Tc/2.
📜 SIMILAR VOLUMES
For the purpose of fabricating alI-YBCO S-N-S Josephson junctions, thin films of YBa2Cu3OT\_~ (YBCO) with reduced critical temperature (YBCO\*) were prepared by means of DC-magnetron sputtering. The YBCO\* films showed a critical temperature around 70 K which could not be increased by an oxygen or o
The surface impedance of several c-axis oriented YBa2Cu3O7 thin-film samples was measured in a copper host cavity at 87 GHz between 4.2 K and 300 K. High aualitv films between 0.17 urn and 0.8 um In thickness have been grown epitaxially on SrTiO3 by pulsed excimer laser~ablation. The partial penetra