Study of defects in implanted silica gla
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R.S. Brusa; S. Mariazzi; L. Ravelli; P. Mazzoldi; G. Mattei; W. Egger; C. Hugens
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Article
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2010
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Elsevier Science
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English
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Positron Annihilation Spectroscopy (PAS) performed with continuous and pulsed positron beams allows to characterize the size of the intrinsic nano-voids in silica glass, their in depth modification after ion implantation and their decoration by implanted ions. Three complementary PAS techniques, lif