Microwave properties of Halide-CVD grown BiSrCaCuO thin films

✍ Scribed by T. Nakamura; C. Yoshida; H. Yamawaki; M. Ihara

• Publisher: Elsevier Science
• Year: 1991
• Tongue: English
• Weight: 477 KB
• Volume: 185-189
• Category: Article
• ISSN: 0921-4534
• DOI: 10.1016/0921-4534(91)91135-q

✦ Synopsis

We have studied the surface resistance (Rs) at 9.6GHz of CVD ~wn BiS~aCuO thin films. Rs val~ as low as 0.2m~ at 60K could be attained in films whose grain sizes are as large as 30ktm. The firms which consi~ of small grains (<0.Spin) showed a dependence of Rs on the rotational misalignments of ~ins. In highly ~nted films. Rs is about 0.6mf~ at 4K which is less than one third of that of rotationaly misaligned film.