We report on the microwa¨e performance and reliability e¨aluation of AlInAsrGaInAsrInP HEMTs with InP as a top surface layer grown by MOCVD. It is found that HEMTs with thin InP surface layers pro¨ide high threshold ¨oltage uniformity, and less thermal and bias stress degradation compared to con¨ent
Microwave performance of InP-based HEMTs for low-voltage application
✍ Scribed by S. Strähle; B. Henle; L. Lee; H. Künzel; T. Hackbarth; J. Dickmann; E. Kohn
- Publisher
- John Wiley and Sons
- Year
- 1996
- Tongue
- English
- Weight
- 734 KB
- Volume
- 11
- Category
- Article
- ISSN
- 0895-2477
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✦ Synopsis
InP-based
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