Microwave Measurements

✍ Scribed by R. Collier, D. Skinner, R. J. Collier, A. D. Skinner

• Publisher: IET
• Year: 2007
• Tongue: English
• Leaves: 506
• Series: Iet Electrical Measurement Series
• Edition: 3
• Category: Library

✦ Synopsis

The IET has organised training courses on microwave measurements since 1983, at which experts have lectured on modern developments. Their lecture notes were first published in book form in 1985 and then again in 1989, and they have proved popular for many years with a readership beyond those who attended the courses. The purpose of this third edition of the lecture notes is to bring the latest techniques in microwave measurements to this wider audience. The book begins with a survey of the theory of current microwave circuits and continues with a description of the techniques for the measurement of power, spectrum, attenuation, circuit parameters, and noise. Various other areas like measurements of antenna characteristics, free fields, modulation and dielectric parameters are also included. The emphasis throughout is on good measurement practice. All the essential theory is given and a previous knowledge of the subject is not assumed.

✦ Table of Contents

Contents......Page 6
List of contributors......Page 18
Preface......Page 20
1.2 Lossless two-conductor transmission lines - equivalent circuit and velocity of propagation......Page 22
1.3 Two-conductor transmission lines with losses - equivalent circuit and low-loss approximation......Page 29
1.4 Lossless waveguides......Page 31
Further reading......Page 38
2.2 One-port devices......Page 40
2.3 Generalised scattering parameters......Page 43
2.4 Impedance and admittance parameters......Page 45
2.5 Cascade parameters......Page 48
2.6 Renormalisation of S-parameters......Page 49
2.7 De-embedding of S-parameters......Page 50
2.8 Characteristic impedance......Page 51
2.9 Signal flow graphs......Page 57
2.A Reciprocity......Page 58
2.B Losslessness......Page 60
2.C Two-port transforms......Page 61
Further reading......Page 62
3.1 Introduction......Page 64
3.2 Sources of uncertainty in RF and microwave measurements......Page 73
References......Page 77
4.1 Introduction......Page 80
4.2 Connector repeatability......Page 82
4.4 Interface dimensions and gauging......Page 83
4.5 Connector cleaning......Page 84
4.8 Connector recession......Page 86
4.B Appendix B......Page 87
4.C Appendix C......Page 106
4.D Appendix D......Page 107
4.E Appendix E......Page 108
Further reading......Page 109
5.2 Basic principles......Page 112
5.3 Measurement systems......Page 114
5.4 Important considerations when making attenuation measurements......Page 131
5.5 A worked example of a 30 dB attenuation measurement......Page 137
References......Page 140
Further reading......Page 141
6.1 Introduction......Page 142
6.2 RF voltage measuring instruments......Page 143
6.3 AC and RF/microwave traceability......Page 154
6.4 Impedance matching and mismatch errors......Page 156
Further reading......Page 164
7.1 Introduction......Page 168
7.2 Coaxial lines......Page 169
7.4 Ridged waveguide......Page 171
7.5 Microstrip......Page 172
7.6 Slot guide......Page 173
7.7 Coplanar waveguide......Page 174
7.9 Dielectric waveguide......Page 175
References......Page 176
Further reading......Page 177
8.1 Introduction......Page 178
8.2 Types of noise......Page 179
8.3 Definitions......Page 181
8.4 Types of noise source......Page 183
8.5 Measuring noise......Page 185
8.6 Measurement accuracy......Page 187
8.7 Mismatch effects......Page 192
8.8 Automated noise measurements......Page 195
References......Page 197
9.1 Introduction......Page 200
9.2 Historical perspective......Page 201
9.3 Connectors......Page 203
9.4 Air lines......Page 209
9.5 RF impedance......Page 214
9.6 Future developments......Page 221
Appendix: 7/16 connectors......Page 222
References......Page 224
10.1 Introduction......Page 228
10.2 Reference plane......Page 229
10.3 Network analyser block diagram......Page 235
Further reading......Page 237
11.1 Introduction......Page 238
11.2 Test fixture measurements......Page 239
11.3 Probe station measurements......Page 251
11.4 Thermal and cryogenic measurements......Page 267
11.5 Experimental field probing techniques......Page 270
11.6 Summary......Page 275
References......Page 276
12.3 Scalar network analysers......Page 284
12.4 Vector network analyser......Page 287
12.5 Calibration of a scalar network analyser......Page 288
12.7 Calibration of a vector network analyser......Page 290
12.8 Accuracy enhancement......Page 291
12.9 Characterising microwave systematic errors......Page 294
12.10 One-port device measurement......Page 297
12.11 Two-port error model......Page 300
12.12 TRL calibration......Page 305
References......Page 310
13.2 Definition of verification......Page 312
13.3 Types of verification......Page 313
13.5 Error term verification......Page 314
13.6 Verification of measurements......Page 322
References......Page 325
14.1 Introduction......Page 326
14.2 Characterisation of balanced structures......Page 330
14.3 Measurement examples......Page 342
14.4 (De)Embedding for balanced device characterisation......Page 347
Further reading......Page 349
15.2 Theory......Page 350
15.3 Power sensors......Page 354
15.4 Power measurements and calibration......Page 358
15.5 Calibration and transfer standards......Page 359
15.6 Power splitters......Page 360
15.7 Couplers and reflectometers......Page 364
15.8 Pulsed power......Page 365
15.10 Acknowledgements......Page 367
References......Page 368
16.1 Part 1: Introduction......Page 370
16.2 Part 2: How the spectrum analyser works......Page 375
16.3 Part 3: Spectrum analyser important specification points......Page 380
16.4 Spectrum analyser applications......Page 397
16.5 Conclusion......Page 414
Further reading......Page 415
17 Measurement of frequency stability and phase noise......Page 416
17.1 Measuring phase noise......Page 417
17.2 Spectrum analysers......Page 418
17.3 Use of preselecting filter with spectrum analysers......Page 420
17.4 Delay line discriminator......Page 421
17.5 Quadrature technique......Page 422
17.6 FM discriminator method......Page 425
17.7 Measurement uncertainty issues......Page 426
17.9 Summary......Page 427
18.1 Introduction......Page 430
18.2 Dielectrics Πbasic parameters......Page 431
18.3 Basic dielectric measurement theory......Page 434
18.4 Loss processes: conduction, dielectric relaxation, resonances......Page 439
18.6 Preliminary considerations for practical dielectric measurements......Page 443
18.7 Some common themes in dielectric measurement......Page 446
18.8 Good practices in RF and MW dielectric measurements......Page 450
18.9 A survey of measurement methods......Page 451
18.11 Further information......Page 470
References......Page 471
19.1 Introduction......Page 480
19.2 Traceability of E-field strength......Page 481
19.3 Antenna factors......Page 485
19.4 Electro-optic sensors and traceability of fields in TEM cells......Page 490
References......Page 491
Index......Page 494

✦ Subjects

Приборостроение;СВЧ-техника;