From typical metrology parameters for common wireless and microwave components to the implementation of measurement benches, this introduction to metrology contains all the key information on the subject. Using it, readers will be able to: โข Interpret and measure most of the parameters described in
Technique of microwave measurements
โ Scribed by C G Montgomery
- Publisher
- New York, McGraw-Hill Book Co
- Year
- 1947
- Tongue
- English
- Leaves
- 939
- Series
- Massachusetts Institute of Technology.; Radiation Laboratory.; Radiation Laboratory series 11
- Edition
- 1st ed
- Category
- Library
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
From typical metrology parameters for common wireless and microwave components to the implementation of measurement benches, this introduction to metrology contains all the key information on the subject. Using it, readers will be able to: ะฒะั Interpret and measure most of the parameters described i
This comprehensive, hands-on review of the most up-to-date techniques in RF and microwave measurement combines microwave circuit theory and metrology, in-depth analysis of advanced modern instrumentation, methods and systems, and practical advice for professional RF and microwave engineers and resea
This book provides state-of-the-art coverage for making measurements on RF and Microwave Components, both active and passive. A perfect reference for R&D and Test Engineers, with topics ranging from the best practices for basic measurements, to an in-depth analysis of errors, correction methods, and