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Microwave interferometry: application to precision measurements and noise reduction techniques

✍ Scribed by Ivanov, E.N.; Tobar, M.E.; Woode, R.A.


Book ID
118003110
Publisher
IEEE
Year
1998
Tongue
English
Weight
385 KB
Volume
45
Category
Article
ISSN
0885-3010

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A high precision technique for pressure
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High precision pressure-induced lineshifts have been measured by a technique involving an infrared diode laser which is frequency stabilized on the absorption peak of the molecular line under study. The corresponding frequency shifts of the stabilized laser are discriminated by means of a reference