Monitoring fluctuations at a synchrotron beamline using matched ion chambers: 2. isolation of component noise sources, and application to attenuation measurements showing increased precision by two orders of magnitude

✍ Scribed by C. T. Chantler; C. Q. Tran; D. Paterson; D. J. Cookson; Z. Barnea

• Publisher: John Wiley and Sons
• Year: 2000
• Tongue: English
• Weight: 103 KB
• Volume: 29
• Category: Article
• ISSN: 0049-8246
• DOI: 10.1002/1097-4539(200011/12)29:6<459::aid-xrs453>3.0.co;2-n