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Microwave density imaging of perfectly conducting objects in the near-field region

✍ Scribed by Tah-Hsiung Chu; Ding-Bing Lin

Book ID
114553376
Publisher
IEEE
Year
1991
Tongue
English
Weight
667 KB
Volume
39
Category
Article
ISSN
0018-9480

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Electric field intensity variation in the vicinity of a perfectly conducting conical probe: Application to near-field microscopy
✍ H. Cory; A. C. Boccara; J. C. Rivoal; A. Lahrech πŸ“‚ Article πŸ“… 1998 πŸ› John Wiley and Sons 🌐 English βš– 142 KB πŸ‘ 2 views

A ¨ibrating metallic conical probe has been used in near-field microscopic measurements to obtain optical resolutions much smaller than the wa¨elength. Numerical simulations of these complex problems ha¨e drawn most of the attention in the past. We propose here an analytical expression for the elect