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Microstructures of thin film La2−xSrxCuO4 on SrTiO3 and LaAlO3

✍ Scribed by D.J. Werder; C.H. Chen; H.L. Kao; J. Kwo


Publisher
Elsevier Science
Year
1992
Tongue
English
Weight
811 KB
Volume
204
Category
Article
ISSN
0921-4534

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The growth characteristics of La 2\_xsr~cuO4 thin films of various thicknesses (10-150 nm), epitaxially grown by laser ablation on (100) SrTiO 3 substrates, were analysed by transmission electron microscopy (TEM) and atomic force microscopy (AFM). A periodic surface roughness with an important peak-