TEM/AFM study of the growth of La2−xSrxC
✍
M.-J. Casanove; A. Alimoussa; M. Schwerdtfeger; S. Gaubert; H. Moriceau; J.-C. V
📂
Article
📅
1995
🏛
Elsevier Science
🌐
English
⚖ 700 KB
The growth characteristics of La 2\_xsr~cuO4 thin films of various thicknesses (10-150 nm), epitaxially grown by laser ablation on (100) SrTiO 3 substrates, were analysed by transmission electron microscopy (TEM) and atomic force microscopy (AFM). A periodic surface roughness with an important peak-