Microstructures and dielectric propertie
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C.M. Huang; S.F. Wang; C.J. Peng; J. Shieh; C.S. Chang; T.S. Lin
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Article
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2006
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Elsevier Science
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English
β 522 KB
Lead zirconate titanate (PZT) thick films have been successfully grown on Pt/Ti-coated (1 0 0) Si substrates by a novel aerosol plasma deposition (APD) method at room temperature. The dielectric constant (K) and loss tangent (tan Ξ΄) of the as-deposited film measured at 100 kHz are 223 and 0.034, res