Parallel twinning during creep deformati
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H.Y. Kim; K. Maruyama
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Article
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2001
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Elsevier Science
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English
β 185 KB
Compression creep tests were conducted in the soft orientation PST TiAl crystals under the constant stress condition with applied stress of 100-316 MPa at 1150 K to investigate the effect of parallel twinning on creep deformation behavior. The effect of applied stress and strain on parallel twinning